TKD uses conventional EBSD hardware and software, but the samples are thin, electron transparent samples. The diffraction signal is obtained from a few to tens of nms of the bottom sample surface, so sample preparation is important.The main difference between EBSD and t-EBSD is how the sample is positioned in the SEM chamber. A typical representation of the configuration required, is shown in figure 1 on page 2. In this representation the sample is positioned at an angle (20 degrees) to the electron beam, however, other studies orientate the sample horizontally. The optimum angle to use depends on the position of the EBSD detector and the working distance. TKD data can be collected and presented in the same way as conventional EBSD data.

 This device allows foils or grids (both standard TEM grids and Nanomanipulator support grids) to be accommodated directly in a reversible cassette. This provides mechanical support to the sample and allows the either surface to be viewed in the SEM, without the need to demount the sample. The cassette can also be mounted on the front face of the block for convention EBSD. An adjustable beam stop prevents stray through beam from scattering back onto the phosphor screen during TKD analysis. This greatly enhances contrast of the Electron Forward Scattered Pattern.